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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Applicati | 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Applicati | 02/12/21 | Keysight Technologies Imaging Grap | 692 kB | 1 | Agilent | 5991-0781EN Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Applicati |
| Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission | Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission | 06/06/21 | Charging Mitigation Strategies in Imagin | 987 kB | 1 | Agilent | Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission |
| Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art 5991-151 | Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art 5991-151 | 21/10/21 | Keysight Technologies Potent | 898 kB | 2 | Agilent | Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology and History of Art 5991-151 |
| Graphene Studies_ Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 | Graphene Studies_ Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 | 04/10/21 | Graphene Studies Using Agilent Nanomeasu | 1410 kB | 1 | Agilent | Graphene Studies Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 |
| 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 26/08/20 | Keysight Technologies High Resolution Im | 266 kB | 1 | Agilent | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4] |
| 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 03/11/21 | Keysight Technologies Current Sensin | 98 kB | 1 | Agilent | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2] |
| 3154_HallEffectArticle.pdf | 3154_HallEffectArticle.pdf | 19/03/20 | A | 451 kB | 0 | Keithley | 3154 HallEffectArticle |
| 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2].pdf | 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2].pdf | 15/06/21 | Keysight Technologies SECM Mode AFM-Enab | 90 kB | 1 | Agilent | 5991-4525EN AFM - Enabled Scanning Electrochemical Microscope (SECM) - Data Sheet c20140829 [2] |
| 5991-4601EN Introduction to SECM and Combined AFM-SECM - Application Note c20140725 [5].pdf | 5991-4601EN Introduction to SECM and Combined AFM-SECM - Application Note c20140725 [5].pdf | 28/10/21 | Keysight Technologies Introduction to SE | 808 kB | 3 | Agilent | 5991-4601EN Introduction to SECM and Combined AFM-SECM - Application Note c20140725 [5] |
| ug_thesis_2005_borrero.pdf | ug_thesis_2005_borrero.pdf | 13/06/20 | A Low-Noise Current Supply for an Electr | 649 kB | 4 | CERN | ug thesis 2005 borrero |
| LowCurrentHiResistance_EHandbook.pdf | LowCurrentHiResistance_EHandbook.pdf | 10/01/20 | 2202 kB | 1 | Keithley | LowCurrentHiResistance EHandbook | |
| LCHR_E-Handbook_071712.pdf | LCHR_E-Handbook_071712.pdf | 05/02/20 | 1467 kB | 1 | Keithley | LCHR E-Handbook 071712 | |
| 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano | 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano | 04/07/21 | Keysight Technologies Three dimensional | 1667 kB | 5 | Agilent | 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano |
| 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 03/08/21 | Keysight Technologies Electromagnetic Si | 2514 kB | 9 | Agilent | 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper |
| 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 12/10/21 | Keysight Technologies 7500 AFM Applicati | 186 kB | 1 | Agilent | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2] |
| 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 26/08/20 | Keysight Technologies AFM/SPM Accessorie | 658 kB | 3 | Agilent | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20] |
| 5991-4606EN Using Fine Resolution to Improve Thermal Images - Application Note c20140722 [5].pdf | 5991-4606EN Using Fine Resolution to Improve Thermal Images - Application Note c20140722 [5].pdf | 26/07/21 | Keysight Technologies Using Fine Resolut | 645 kB | 0 | Agilent | 5991-4606EN Using Fine Resolution to Improve Thermal Images - Application Note c20140722 [5] |
| 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 27/11/19 | Keysight Technologies 5500 AFM | 1889 kB | 2 | Agilent | 5989-6405EN English 2013-08-30 PDF 1.31 MB c20141106 [8] |
| 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 28/08/20 | 290 kB | 1 | Agilent | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2] | |
| 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 12/10/21 | Keysight Technologies Magnetic Force Mic | 287 kB | 1 | Agilent | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 |